Dual phase-detected infrared photothermal microscopy
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chanjong Park | - |
dc.contributor.author | Minhaeng Cho | - |
dc.date.accessioned | 2024-03-29T02:30:05Z | - |
dc.date.available | 2024-03-29T02:30:05Z | - |
dc.date.created | 2024-03-11 | - |
dc.date.issued | 2024-02 | - |
dc.identifier.issn | 1094-4087 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/14962 | - |
dc.description.abstract | Infrared photothermal microscopy (IPM) has recently gained considerable attention as a versatile analytical platform capable of providing spatially resolved molecular insights across diverse research fields. This technique has led to numerous breakthroughs in the study of compositional variations in functional materials and cellular dynamics in living cells. However, its application to investigate multiple components of temporally dynamic systems, such as living cells and operational devices, has been hampered by the limited information content of the IP signal, which only covers a narrow spectral window (< 1 cm−1). Here, we present a straightforward approach for measuring two distinct IPM images utilizing the orthogonality between the in-phase and quadrature outputs of a lock-in amplifier, called dual-phase IR photothermal (DP-IP) detection. We demonstrate the feasibility of DP-IP detection for IPM in distinguishing two different micro-sized polymer beads. © 2024 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement. | - |
dc.language | 영어 | - |
dc.publisher | Optical Society of America | - |
dc.title | Dual phase-detected infrared photothermal microscopy | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 001202200400003 | - |
dc.identifier.scopusid | 2-s2.0-85186127891 | - |
dc.identifier.rimsid | 82659 | - |
dc.contributor.affiliatedAuthor | Chanjong Park | - |
dc.contributor.affiliatedAuthor | Minhaeng Cho | - |
dc.identifier.doi | 10.1364/OE.510044 | - |
dc.identifier.bibliographicCitation | Optics Express, v.32, no.5, pp.6865 - 6875 | - |
dc.relation.isPartOf | Optics Express | - |
dc.citation.title | Optics Express | - |
dc.citation.volume | 32 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 6865 | - |
dc.citation.endPage | 6875 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | Y | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |