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Flexoelectric Rectification of Charge Transport in Strain-Graded Dielectrics

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dc.contributor.authorDaesu Lee-
dc.contributor.authorSang Mo Yang-
dc.contributor.authorJong-Gul Yoon-
dc.contributor.authorTae Won Noh-
dc.date.available2015-04-20T07:24:24Z-
dc.date.created2014-08-11-
dc.date.issued2012-12-
dc.identifier.issn1530-6984-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/1419-
dc.description.abstractFlexoelectricity is emerging as a fascinating means for exploring the physical properties of nanoscale materials. Here, we demonstrated the unusual coupling between electronic transport and the mechanical strain gradient in a dielectric epitaxial thin film. Utilizing the nanoscale strain gradient, we showed the unique functionality of flexoelectricity to generate a rectifying diode effect. Furthermore, using conductive atomic force microscopy, we found that the flexoelectric effect can govern the local transport characteristics, including spatial conduction inhomogeneities, in thin-film epitaxy systems. Consideration of the flexoelectric effect will improve understanding of the charge conduction mechanism at the nanoscale and may facilitate the advancement of novel nanoelectronic device design. © 2012 American Chemical Society.-
dc.language영어-
dc.publisherAMER CHEMICAL SOC-
dc.subjectCharge conduction-
dc.subjectConductive atomic force microscopy-
dc.subjectDiode effects-
dc.subjectElectronic transport-
dc.subjectEpitaxial thin films-
dc.subjectEpitaxy systems-
dc.subjectFlexoelectric-
dc.subjectFlexoelectric effects-
dc.subjectFlexoelectricity-
dc.subjectInhomogeneities-
dc.subjectLocal transport-
dc.subjectMechanical strain-
dc.subjectNano scale-
dc.subjectNano-scale materials-
dc.subjectNanoelectronic devices-
dc.subjectStrain gradients-
dc.subjectAtomic force microscopy-
dc.subjectDielectric materials-
dc.subjectEpitaxial growth-
dc.subjectTransportation-
dc.subjectNanotechnology-
dc.titleFlexoelectric Rectification of Charge Transport in Strain-Graded Dielectrics-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000312122100065-
dc.identifier.scopusid2-s2.0-84870927351-
dc.identifier.rimsid192ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorDaesu Lee-
dc.contributor.affiliatedAuthorSang Mo Yang-
dc.contributor.affiliatedAuthorTae Won Noh-
dc.identifier.doi10.1021/nl3038129-
dc.identifier.bibliographicCitationNANO LETTERS, v.12, no.12, pp.6436 - 6440-
dc.relation.isPartOfNANO LETTERS-
dc.citation.titleNANO LETTERS-
dc.citation.volume12-
dc.citation.number12-
dc.citation.startPage6436-
dc.citation.endPage6440-
dc.date.scptcdate2018-10-01-
dc.description.wostc22-
dc.description.scptc23-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusMORPHOTROPIC PHASE-BOUNDARY-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusPOLARIZATION-
dc.subject.keywordPlusSTRESS-
dc.subject.keywordAuthorEpitaxial thin film-
dc.subject.keywordAuthorflexoelectricity-
dc.subject.keywordAuthorlocal transport-
dc.subject.keywordAuthornanoscale strain gradient-
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > 1. Journal Papers (저널논문)
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2012-12-12-Nano Letters-Flexoelectric rectification.pdfDownload

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