Flexoelectric Rectification of Charge Transport in Strain-Graded Dielectrics
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Daesu Lee | - |
dc.contributor.author | Sang Mo Yang | - |
dc.contributor.author | Jong-Gul Yoon | - |
dc.contributor.author | Tae Won Noh | - |
dc.date.available | 2015-04-20T07:24:24Z | - |
dc.date.created | 2014-08-11 | - |
dc.date.issued | 2012-12 | - |
dc.identifier.issn | 1530-6984 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/1419 | - |
dc.description.abstract | Flexoelectricity is emerging as a fascinating means for exploring the physical properties of nanoscale materials. Here, we demonstrated the unusual coupling between electronic transport and the mechanical strain gradient in a dielectric epitaxial thin film. Utilizing the nanoscale strain gradient, we showed the unique functionality of flexoelectricity to generate a rectifying diode effect. Furthermore, using conductive atomic force microscopy, we found that the flexoelectric effect can govern the local transport characteristics, including spatial conduction inhomogeneities, in thin-film epitaxy systems. Consideration of the flexoelectric effect will improve understanding of the charge conduction mechanism at the nanoscale and may facilitate the advancement of novel nanoelectronic device design. © 2012 American Chemical Society. | - |
dc.language | 영어 | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.subject | Charge conduction | - |
dc.subject | Conductive atomic force microscopy | - |
dc.subject | Diode effects | - |
dc.subject | Electronic transport | - |
dc.subject | Epitaxial thin films | - |
dc.subject | Epitaxy systems | - |
dc.subject | Flexoelectric | - |
dc.subject | Flexoelectric effects | - |
dc.subject | Flexoelectricity | - |
dc.subject | Inhomogeneities | - |
dc.subject | Local transport | - |
dc.subject | Mechanical strain | - |
dc.subject | Nano scale | - |
dc.subject | Nano-scale materials | - |
dc.subject | Nanoelectronic devices | - |
dc.subject | Strain gradients | - |
dc.subject | Atomic force microscopy | - |
dc.subject | Dielectric materials | - |
dc.subject | Epitaxial growth | - |
dc.subject | Transportation | - |
dc.subject | Nanotechnology | - |
dc.title | Flexoelectric Rectification of Charge Transport in Strain-Graded Dielectrics | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000312122100065 | - |
dc.identifier.scopusid | 2-s2.0-84870927351 | - |
dc.identifier.rimsid | 192 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Daesu Lee | - |
dc.contributor.affiliatedAuthor | Sang Mo Yang | - |
dc.contributor.affiliatedAuthor | Tae Won Noh | - |
dc.identifier.doi | 10.1021/nl3038129 | - |
dc.identifier.bibliographicCitation | NANO LETTERS, v.12, no.12, pp.6436 - 6440 | - |
dc.relation.isPartOf | NANO LETTERS | - |
dc.citation.title | NANO LETTERS | - |
dc.citation.volume | 12 | - |
dc.citation.number | 12 | - |
dc.citation.startPage | 6436 | - |
dc.citation.endPage | 6440 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 22 | - |
dc.description.scptc | 23 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | MORPHOTROPIC PHASE-BOUNDARY | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | POLARIZATION | - |
dc.subject.keywordPlus | STRESS | - |
dc.subject.keywordAuthor | Epitaxial thin film | - |
dc.subject.keywordAuthor | flexoelectricity | - |
dc.subject.keywordAuthor | local transport | - |
dc.subject.keywordAuthor | nanoscale strain gradient | - |