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원자제어저차원전자계연구단
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Resonant inelastic X-ray scattering endstation at the 1C beamline of Pohang Light Source II

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dc.contributor.authorJin-Kwang Kim-
dc.contributor.authorChristopher Dietl-
dc.contributor.authorHyun-Woo J. Kim-
dc.contributor.authorSeung-Hyeok Ha-
dc.contributor.authorJimin Kim-
dc.contributor.authorSaid, Ayman H.-
dc.contributor.authorKim, Jungho-
dc.contributor.authorB. J. Kim-
dc.date.accessioned2023-11-16T22:00:45Z-
dc.date.available2023-11-16T22:00:45Z-
dc.date.created2023-05-30-
dc.date.issued2023-05-
dc.identifier.issn0909-0495-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/14161-
dc.description.abstractAn endstation for resonant inelastic X-ray scattering (RIXS), dedicated to operations in the hard X-ray regime, has been constructed at the 1C beamline of Pohang Light Source II. At the Ir L-3-edge, a total energy resolution of 34.2 meV was achieved, close to the theoretical estimation of 34.0 meV, which considers factors such as the incident energy bandpass, intrinsic analyzer resolution, geometrical broadening of the spectrometer, finite beam-size effect and Johann aberration. The performance of the RIXS instrument is demonstrated by measuring the RIXS spectra of Sr2IrO4. The endstation can be easily reconfigured to measure energy-integrated intensities with very low background for diffuse scattering and diffraction experiments.-
dc.language영어-
dc.publisherINT UNION CRYSTALLOGRAPHY-
dc.titleResonant inelastic X-ray scattering endstation at the 1C beamline of Pohang Light Source II-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000980808100019-
dc.identifier.scopusid2-s2.0-85159551006-
dc.identifier.rimsid80875-
dc.contributor.affiliatedAuthorJin-Kwang Kim-
dc.contributor.affiliatedAuthorChristopher Dietl-
dc.contributor.affiliatedAuthorHyun-Woo J. Kim-
dc.contributor.affiliatedAuthorSeung-Hyeok Ha-
dc.contributor.affiliatedAuthorJimin Kim-
dc.contributor.affiliatedAuthorB. J. Kim-
dc.identifier.doi10.1107/S1600577523001625-
dc.identifier.bibliographicCitationJOURNAL OF SYNCHROTRON RADIATION, v.30, pp.643 - 649-
dc.relation.isPartOfJOURNAL OF SYNCHROTRON RADIATION-
dc.citation.titleJOURNAL OF SYNCHROTRON RADIATION-
dc.citation.volume30-
dc.citation.startPage643-
dc.citation.endPage649-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusMONOCHROMATORS-
dc.subject.keywordPlusSPECTROMETER-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusANALYZERS-
dc.subject.keywordAuthorresonant inelastic X-ray scattering-
dc.subject.keywordAuthorRIXS spectrometer-
dc.subject.keywordAuthor1C beamline-
dc.subject.keywordAuthorPLS-II-
dc.subject.keywordAuthorhard X-rays-
Appears in Collections:
Center for Artificial Low Dimensional Electronic Systems(원자제어 저차원 전자계 연구단) > 1. Journal Papers (저널논문)
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