Resonant inelastic X-ray scattering endstation at the 1C beamline of Pohang Light Source II
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jin-Kwang Kim | - |
dc.contributor.author | Christopher Dietl | - |
dc.contributor.author | Hyun-Woo J. Kim | - |
dc.contributor.author | Seung-Hyeok Ha | - |
dc.contributor.author | Jimin Kim | - |
dc.contributor.author | Said, Ayman H. | - |
dc.contributor.author | Kim, Jungho | - |
dc.contributor.author | B. J. Kim | - |
dc.date.accessioned | 2023-11-16T22:00:45Z | - |
dc.date.available | 2023-11-16T22:00:45Z | - |
dc.date.created | 2023-05-30 | - |
dc.date.issued | 2023-05 | - |
dc.identifier.issn | 0909-0495 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/14161 | - |
dc.description.abstract | An endstation for resonant inelastic X-ray scattering (RIXS), dedicated to operations in the hard X-ray regime, has been constructed at the 1C beamline of Pohang Light Source II. At the Ir L-3-edge, a total energy resolution of 34.2 meV was achieved, close to the theoretical estimation of 34.0 meV, which considers factors such as the incident energy bandpass, intrinsic analyzer resolution, geometrical broadening of the spectrometer, finite beam-size effect and Johann aberration. The performance of the RIXS instrument is demonstrated by measuring the RIXS spectra of Sr2IrO4. The endstation can be easily reconfigured to measure energy-integrated intensities with very low background for diffuse scattering and diffraction experiments. | - |
dc.language | 영어 | - |
dc.publisher | INT UNION CRYSTALLOGRAPHY | - |
dc.title | Resonant inelastic X-ray scattering endstation at the 1C beamline of Pohang Light Source II | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000980808100019 | - |
dc.identifier.scopusid | 2-s2.0-85159551006 | - |
dc.identifier.rimsid | 80875 | - |
dc.contributor.affiliatedAuthor | Jin-Kwang Kim | - |
dc.contributor.affiliatedAuthor | Christopher Dietl | - |
dc.contributor.affiliatedAuthor | Hyun-Woo J. Kim | - |
dc.contributor.affiliatedAuthor | Seung-Hyeok Ha | - |
dc.contributor.affiliatedAuthor | Jimin Kim | - |
dc.contributor.affiliatedAuthor | B. J. Kim | - |
dc.identifier.doi | 10.1107/S1600577523001625 | - |
dc.identifier.bibliographicCitation | JOURNAL OF SYNCHROTRON RADIATION, v.30, pp.643 - 649 | - |
dc.relation.isPartOf | JOURNAL OF SYNCHROTRON RADIATION | - |
dc.citation.title | JOURNAL OF SYNCHROTRON RADIATION | - |
dc.citation.volume | 30 | - |
dc.citation.startPage | 643 | - |
dc.citation.endPage | 649 | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | MONOCHROMATORS | - |
dc.subject.keywordPlus | SPECTROMETER | - |
dc.subject.keywordPlus | PERFORMANCE | - |
dc.subject.keywordPlus | ANALYZERS | - |
dc.subject.keywordAuthor | resonant inelastic X-ray scattering | - |
dc.subject.keywordAuthor | RIXS spectrometer | - |
dc.subject.keywordAuthor | 1C beamline | - |
dc.subject.keywordAuthor | PLS-II | - |
dc.subject.keywordAuthor | hard X-rays | - |