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Dynamics of weak magnetic coupling by x-ray ferromagnetic resonance

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Title
Dynamics of weak magnetic coupling by x-ray ferromagnetic resonance
Author(s)
Kim, Changsoo; Choi, Won-Chang; Moon, Kyoung-Woong; Kim, Hyun-Joong; An, Kyongmo; Park, Byeong-Gyu; Kim, Ho-Young; Hong, Jung-Il; Jaeyoung Kim; Qiu, Zi Q.; Kim, Younghak; Hwang, Chanyong
Publication Date
2023-05
Journal
Journal of Applied Physics, v.133, no.17
Publisher
American Institute of Physics Inc.
Abstract
We investigate the interaction between two magnetic layers separated with a normal metal insertion layer (Ti, Pt, and Ru) using x-ray ferromagnetic resonance (XFMR). We measure the amplitude and phase of the ferromagnetic resonance of both layers. Our results indicate that a ferromagnetic exchange coupling between two layers is a dominant coupling mechanism for a thick insertion metal layer. Based on the exchange coupling model, we extract the smallest value of the indirect exchange coefficient of 1.2 μJ/m2, which corresponds to an exchange field of about 0.36 mT. While this value is difficult to measure with other experimental tools, we were able to measure the small value because XFMR detects a resonance phenomenon of a thin layer generated by an oscillating indirect exchange and the Oersted fields with a phase and layer resolved observation.
URI
https://pr.ibs.re.kr/handle/8788114/14073
DOI
10.1063/5.0141994
ISSN
0021-8979
Appears in Collections:
Center for Artificial Low Dimensional Electronic Systems(원자제어 저차원 전자계 연구단) > 1. Journal Papers (저널논문)
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