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In-situ imaging of the electrode surface during electrochemical reactions with a beetle-type electrochemical scanning tunneling microscope

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dc.contributor.authorYongman Kim-
dc.contributor.authorJoong Il Jake Choi-
dc.contributor.authorYongchan Jeong-
dc.contributor.authorYoung Jae Kim-
dc.contributor.authorJeong Young Park-
dc.date.accessioned2023-05-11T22:00:28Z-
dc.date.available2023-05-11T22:00:28Z-
dc.date.created2023-04-28-
dc.date.issued2023-06-
dc.identifier.issn1567-1739-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/13333-
dc.description.abstractIn this paper, we present the design and performances of a beetle-type electrochemical scanning tunneling microscope (EC-STM) which allows horizontal tip motion at millimeter range (5 mm × 5 mm). With its symmetrical scanner design inducing a relatively low thermal drift, the beetle-type EC-STM has the desirable ability to operate in a variety of chemical reactions. Atom-resolved high-resolution STM images of highly oriented pyrolytic graphite (HOPG) and Au(111) surfaces in the liquid phase are presented to confirm the scan performance of the beetle-type EC-STM, which also provides in situ information on the electrode surface during electrochemical reactions, including adsorbed– and desorbed– electrolyte and metal electrodeposition. These systemically obtained STM images on the electrode surface clearly demonstrate the high stability of the newly developed EC‐STM under reaction conditions. © 2023 Korean Physical Society-
dc.language영어-
dc.publisherElsevier-
dc.titleIn-situ imaging of the electrode surface during electrochemical reactions with a beetle-type electrochemical scanning tunneling microscope-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000975164600001-
dc.identifier.scopusid2-s2.0-85151504448-
dc.identifier.rimsid80613-
dc.contributor.affiliatedAuthorYongman Kim-
dc.contributor.affiliatedAuthorJoong Il Jake Choi-
dc.contributor.affiliatedAuthorYongchan Jeong-
dc.contributor.affiliatedAuthorYoung Jae Kim-
dc.contributor.affiliatedAuthorJeong Young Park-
dc.identifier.doi10.1016/j.cap.2023.03.016-
dc.identifier.bibliographicCitationCurrent Applied Physics, v.50, pp.74 - 80-
dc.relation.isPartOfCurrent Applied Physics-
dc.citation.titleCurrent Applied Physics-
dc.citation.volume50-
dc.citation.startPage74-
dc.citation.endPage80-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusRECONSTRUCTED AU(111) SURFACE-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordPlusLOW-TEMPERATURE-
dc.subject.keywordPlusSTM-
dc.subject.keywordPlusDIRECTION-
dc.subject.keywordPlusLIQUID-
dc.subject.keywordAuthorElectrochemical scanning tunneling microscopy-
dc.subject.keywordAuthorElectrochemistry-
dc.subject.keywordAuthorElectrodeposition-
Appears in Collections:
Center for Nanomaterials and Chemical Reactions(나노물질 및 화학반응 연구단) > 1. Journal Papers (저널논문)
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