Two opposite hysteresis curves in semiconductors with mobile dopants
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jae Sung Lee | - |
dc.contributor.author | Shin Buhm Lee | - |
dc.contributor.author | Byungnam Kahng | - |
dc.contributor.author | Tae Won Noh | - |
dc.date.available | 2015-04-20T06:58:22Z | - |
dc.date.created | 2014-08-11 | - |
dc.date.issued | 2013-06 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/1321 | - |
dc.description.abstract | Semiconductors with mobile dopants (SMDs), which are distinct from conventional semiconductors, exhibit hysteretic current-voltage curves. The fundamental feature of this hysteresis curve is that it exhibits two oppositely rotating directions, whose origin is not clarified yet. Here, we investigate microscopic origin of the two types of curves and show that they result from the spatial inhomogeneity of the mobile dopant distribution in the SMD. In particular, we observed an abnormal modulation of the electronic energy band due to mobile dopants; lower (higher) density of dopants near a metal-semiconductor interface lead to higher (lower) conductance, whereas the conventional ionic models predict the reverse behaviors. © 2013 AIP Publishing LLC. | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | Current voltage curve | - |
dc.subject | Dopant distribution | - |
dc.subject | Electronic energies | - |
dc.subject | Fundamental features | - |
dc.subject | Metal semiconductor interface | - |
dc.subject | Reverse behavior | - |
dc.subject | Rotating direction | - |
dc.subject | Spatial in-homogeneity | - |
dc.subject | Hysteresis | - |
dc.subject | Doping (additives) | - |
dc.title | Two opposite hysteresis curves in semiconductors with mobile dopants | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000321145200089 | - |
dc.identifier.scopusid | 2-s2.0-84879874462 | - |
dc.identifier.rimsid | 195 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Shin Buhm Lee | - |
dc.contributor.affiliatedAuthor | Tae Won Noh | - |
dc.identifier.doi | 10.1063/1.4811556 | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.102, no.25, pp.253503-1 - 253503-4 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 102 | - |
dc.citation.number | 25 | - |
dc.citation.startPage | 253503-1 | - |
dc.citation.endPage | 253503-4 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 14 | - |
dc.description.scptc | 13 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | RESISTIVE SWITCHING MEMORIES | - |
dc.subject.keywordPlus | DOPED SRTIO3 | - |
dc.subject.keywordPlus | NANODEVICES | - |
dc.subject.keywordPlus | RESISTANCE | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordPlus | OXIDE | - |