Theoretical and experimental studies on the electronic structure of crystalline and amorphous ZnSnO3 thin films
DC Field | Value | Language |
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dc.contributor.author | Joohwi Lee | - |
dc.contributor.author | Deok-Yong Cho | - |
dc.contributor.author | Jisim Jung | - |
dc.contributor.author | Un Ki Kim | - |
dc.contributor.author | Sang Ho Rha | - |
dc.contributor.author | Cheol Seong Hwang | - |
dc.contributor.author | Jung-Hae Choi | - |
dc.date.available | 2015-04-20T06:54:26Z | - |
dc.date.created | 2014-08-11 | - |
dc.date.issued | 2013-06 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/1305 | - |
dc.description.abstract | The influence of structural disorder on the electronic structure of amorphous ZnSnO3 was examined by ab-initio calculations. The calculation results are compared with the experimental results using as-deposited and annealed ZnSnO3 films grown by atomic layer deposition. The O K-edge X-ray absorption spectroscopy, X-ray diffraction, and thin-film transistors were employed in the experiment. The conduction band minima of amorphous and crystalline ZnSnO3 mainly consisted of Sn 5s state, while a higher non-uniform localization of these states was observed in the amorphous phase compared with the crystalline counterpart. The experimental results coincide well with the theoretical results.(C) 2013 AIP Publishing LLC. | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Theoretical and experimental studies on the electronic structure of crystalline and amorphous ZnSnO3 thin films | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000320962400052 | - |
dc.identifier.scopusid | 2-s2.0-84879816229 | - |
dc.identifier.rimsid | 211 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Deok-Yong Cho | - |
dc.identifier.doi | 10.1063/1.4811788 | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.102, no.24, pp.242111 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 102 | - |
dc.citation.number | 24 | - |
dc.citation.startPage | 242111 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 10 | - |
dc.description.scptc | 14 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |