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나노물질및화학반응연구단
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Nanoscale Resistive Switching Schottky Contacts on Self-Assembled Pt Nanodots on SrTiO3

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dc.contributor.authorHyunsoo Lee-
dc.contributor.authorHaeri Kim-
dc.contributor.authorTrong Nghia Van-
dc.contributor.authorDong-Wook Kim-
dc.contributor.authorJeong Young Park-
dc.date.available2015-04-20T06:36:49Z-
dc.date.created2014-08-11-
dc.date.issued2013-11-
dc.identifier.issn1944-8244-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/1221-
dc.description.abstractA nanoscale Schottky diode using Pt nanodisks on a Nb-doped SrTiO3 (Nb:STO) single crystal was fabricated, and resistive switching (RS) was demonstrated with conductive atomic force microscopy at ultrahigh vacuum. Pt disks with diameters on the order of 10 nm were formed using colloidal self-assembled patterns of silica nanospheres, followed by evaporation of the Pt layers on the Nb:STO single crystal. Here we show that the reproducible bipolar RS behavior of the nanoscale Pt/Nb:STO Schottky junction was achieved by utilizing local current-voltage spectroscopy. The conductance images, obtained simultaneously with topographic images, show the homogeneous current distribution of selected triangular-shaped Pt during repetitive resistive switching between the high-resistance state (HRS) and low-resistance state (LRS). The endurance characteristics of the Pt/Nb:STO junction exhibit reliable switching behavior. These results suggest that the rectifying and resistive Pt/Nb:STO junction can be scaled down to the 10 nm range and their position can be controlled.-
dc.description.uri1-
dc.language영어-
dc.publisherAMER CHEMICAL SOC-
dc.subjectPt/nb-doped Srtio3 single crystal, schottky junction, scling down, conductive atomic force microscopy, spatial mapping-
dc.titleNanoscale Resistive Switching Schottky Contacts on Self-Assembled Pt Nanodots on SrTiO3-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000327812300027-
dc.identifier.scopusid2-s2.0-84889255984-
dc.identifier.rimsid506ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorHyunsoo Lee-
dc.contributor.affiliatedAuthorTrong Nghia Van-
dc.contributor.affiliatedAuthorJeong Young Park-
dc.identifier.doi10.1021/am4032086-
dc.identifier.bibliographicCitationACS APPLIED MATERIALS & INTERFACES, v.5, no.22, pp.11668 - 11672-
dc.citation.titleACS APPLIED MATERIALS & INTERFACES-
dc.citation.volume5-
dc.citation.number22-
dc.citation.startPage11668-
dc.citation.endPage11672-
dc.date.scptcdate2018-10-01-
dc.description.wostc20-
dc.description.scptc20-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
Appears in Collections:
Center for Nanomaterials and Chemical Reactions(나노물질 및 화학반응 연구단) > 1. Journal Papers (저널논문)
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