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Li, Bao-Wen
다차원 탄소재료 연구단
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Study of multi-layered graphene by ultra-low energy SEM/STEM

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Title
Study of multi-layered graphene by ultra-low energy SEM/STEM
Author(s)
Milonekova, E.; Frank, L.; Muellerova, I.; Bao Wen Li; Rodney S. Ruoff; Lejeune, M.
Publication Date
2016-03
Journal
DIAMOND AND RELATED MATERIALS, v.63, pp.136 - 142
Publisher
ELSEVIER SCIENCE SA
Abstract
Scanning electron microscopy with very slow electrons offers a novel tool enabling one to image the graphene samples at nanometer or even sub-nanometer lateral resolution in transmitted as well as reflected electrons and to count reliably the atomic layers in both imaging modes. The study was performed on graphene prepared by chemical vapor deposition on thin copper foil. Observation by slow electrons has also confirmed the underlayer mechanism of nucleation and growth bellow already existing graphene layers on copper. Moreover, electrons with impacted energy below 100 eV can be used for "cleaning" of a material. It leads to elimination of the contamination process during the measurement, which enables to observe the predicted oscillations in reflection mode and to measure the transmissivity of various stacks of layers in transmission mode down to units of eV. (C) 2015 Elsevier B.V. All rights reserved.
URI
https://pr.ibs.re.kr/handle/8788114/12132
DOI
10.1016/j.diamond.2015.12.012
ISSN
0925-9635
Appears in Collections:
Center for Multidimensional Carbon Materials(다차원 탄소재료 연구단) > 1. Journal Papers (저널논문)
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