Low Temperature Measurement of the Electrical Conductivity in Amorphous InGaZnO Thin Films
DC Field | Value | Language |
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dc.contributor.author | Hasung Sim | - |
dc.contributor.author | Seongil Choi | - |
dc.contributor.author | Je Geun Park | - |
dc.contributor.author | Jaewon Song | - |
dc.contributor.author | Seungwu Han | - |
dc.contributor.author | Cheol Seong Hwang | - |
dc.contributor.author | Deok-Yong Cho | - |
dc.date.available | 2015-04-20T06:28:39Z | - |
dc.date.created | 2014-08-11 | - |
dc.date.issued | 2014-02 | - |
dc.identifier.issn | 2162-8769 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/1186 | - |
dc.description.abstract | We examine the temperature-dependent electrical conductivity in amorphous InGaZnO thin films with various cation compositions. In-rich films are metallic, while Ga-rich films are semiconducting with logarithmic conductivities linear to -T−1/4 above T = 60 K. The Zn-rich films are also semiconducting but have >102 times higher conductivity than the Ga-rich films. At T > 60 K, thermal electronic excitation dominantly contributes the conduction, while at T < 60 K, certain impurity scatterings or structural disorders have importance in the electrical properties in low carrier a-IGZO system. | - |
dc.language | 영어 | - |
dc.publisher | Electrochemical Society | - |
dc.title | Low Temperature Measurement of the Electrical Conductivity in Amorphous InGaZnO Thin Films | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000331485600006 | - |
dc.identifier.scopusid | 2-s2.0-84893796547 | - |
dc.identifier.rimsid | 2 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Hasung Sim | - |
dc.contributor.affiliatedAuthor | Seongil Choi | - |
dc.contributor.affiliatedAuthor | Je Geun Park | - |
dc.contributor.affiliatedAuthor | Deok-Yong Cho | - |
dc.identifier.doi | 10.1149/2.003402jss | - |
dc.identifier.bibliographicCitation | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.3, no.2, pp.P10 - P12 | - |
dc.relation.isPartOf | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | - |
dc.citation.title | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | - |
dc.citation.volume | 3 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | P10 | - |
dc.citation.endPage | P12 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 3 | - |
dc.description.scptc | 3 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |