Impact of vacancy clusters on characteristic resistance change of nonstoichiometric strontium titanate nano-film
DC Field | Value | Language |
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dc.contributor.author | Yong Su Kim | - |
dc.contributor.author | Jiyeon Kim | - |
dc.contributor.author | Moon Jee Yoon | - |
dc.contributor.author | Chang Hee Sohn | - |
dc.contributor.author | Shin Buhm Lee | - |
dc.contributor.author | Daesu Lee | - |
dc.contributor.author | Byung Chul Jeon | - |
dc.contributor.author | Hyang Keun Yoo | - |
dc.contributor.author | Tae Won Noh | - |
dc.contributor.author | Bostwick, Aaron | - |
dc.contributor.author | Rotenberg, Eli | - |
dc.contributor.author | Yu, Jaejun | - |
dc.contributor.author | Bu, Sang Don | - |
dc.contributor.author | Mun, Bongjin Simon | - |
dc.date.available | 2015-04-20T06:22:16Z | - |
dc.date.created | 2014-08-11 | - |
dc.date.issued | 2014-01 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/1158 | - |
dc.description.abstract | In practical applications to bipolar resistance switching (BRS) memory devices with enhanced performance and high-scalability, oxide materials are commonly fabricated to highly nonstoichiometric and nanometer scale films. In this study, we fabricated ultrathin strontium titanate film, which shows two types of BRS behavior. By using micro-beam X-ray photoemission spectroscopy, the changes of core-level spectra depending on the resistance states are spatially resolved. Experimental and calculated results demonstrated that the fundamental switching mechanism in the two types of BRS is originated from the migration of anion and cation vacancies and the formation of insulating vacancy clusters near vicinity of the interface. (C) 2014 AIP Publishing LLC. | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | RESISTIVE SWITCHING MEMORIES | - |
dc.subject | DOPED SRTIO3 | - |
dc.subject | THIN-FILMS | - |
dc.title | Impact of vacancy clusters on characteristic resistance change of nonstoichiometric strontium titanate nano-film | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000329838800088 | - |
dc.identifier.scopusid | 2-s2.0-84892173879 | - |
dc.identifier.rimsid | 220 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Yong Su Kim | - |
dc.contributor.affiliatedAuthor | Moon Jee Yoon | - |
dc.contributor.affiliatedAuthor | Chang Hee Sohn | - |
dc.contributor.affiliatedAuthor | Shin Buhm Lee | - |
dc.contributor.affiliatedAuthor | Daesu Lee | - |
dc.contributor.affiliatedAuthor | Byung Chul Jeon | - |
dc.contributor.affiliatedAuthor | Hyang Keun Yoo | - |
dc.contributor.affiliatedAuthor | Tae Won Noh | - |
dc.identifier.doi | 10.1063/1.4860961 | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.104, no.1, pp.13501 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 104 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 13501 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 11 | - |
dc.description.scptc | 12 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | RESISTIVE SWITCHING MEMORIES | - |
dc.subject.keywordPlus | DOPED SRTIO3 | - |
dc.subject.keywordPlus | THIN-FILMS | - |