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Bielawsk, Christopher W
다차원 탄소재료 연구단
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X-ray photoelectron spectroscopy investigation of the valence band offset at beryllium oxide-diamond interfaces (vol 101, 107647, 2020)

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Title
X-ray photoelectron spectroscopy investigation of the valence band offset at beryllium oxide-diamond interfaces (vol 101, 107647, 2020)
Author(s)
Donghyi Koh; Todd W. Hudnall; Christopher W. Bielawski; Sanjay K. Banerjee; Justin Brockman; Markus Kuhn; Sean W. King
Publication Date
2021-01
Journal
DIAMOND AND RELATED MATERIALS, v.111
Publisher
ELSEVIER SCIENCE SA
URI
https://pr.ibs.re.kr/handle/8788114/10472
DOI
10.1016/j.diamond.2020.108217
ISSN
0925-9635
Appears in Collections:
Center for Multidimensional Carbon Materials(다차원 탄소재료 연구단) > 1. Journal Papers (저널논문)
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