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Publication Date2014-12 Microstructural Characteristics of Tin Oxide-Based Thin Films on (0001) Al2O3 Substrates: Effects of Substrate Temperature and RF Power During Co-Sputtering
Sooyeon Hwang; Ju Ho Lee; Young Yi Kim, et al
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.14, no.12, pp.8908 - 8914
Publication Date2013-03 Microstructural characterization and formation mechanism of 21° top facets of ZnO-based nanowall structures
Ju Ho Lee; Kim D.C.; Sang Yun Kim, et al
PHYSICA B-CONDENSED MATTER, v.412, pp.12 - 16

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