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원자제어저차원전자계연구단
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Quartz-based flat-crystal resonant inelastic x-ray scattering spectrometer with sub-10 meV energy resolution

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dc.contributor.authorJungho Kim-
dc.contributor.authorD.Casa-
dc.contributor.authorAlman Said-
dc.contributor.authorRich Krakora-
dc.contributor.authorBum Jun Kim-
dc.contributor.authorElina Kasman-
dc.contributor.authorXianrong Huang-
dc.contributor.authorT. Gog-
dc.date.available2019-01-03T05:34:27Z-
dc.date.created2018-11-27-
dc.date.issued2018-01-
dc.identifier.issn2045-2322-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/5302-
dc.description.abstractContinued improvement of the energy resolution of resonant inelastic x-ray scattering (RIXS) spectrometers is crucial for fulfilling the potential of this technique in the study of electron dynamics in materials of fundamental and technological importance. In particular, RIXS is the only alternative tool to inelastic neutron scattering capable of providing fully momentum resolved information on dynamic spin structures of magnetic materials, but is limited to systems whose magnetic excitation energy scales are comparable to the energy resolution. The state-of-the-art spherical diced crystal analyzer optics provides energy resolution as good as 25 meV but has already reached its theoretical limit. Here, we demonstrate a novel sub-10 meV RIXS spectrometer based on flat-crystal optics at the Ir-L3 absorption edge (11.215 keV) that achieves an analyzer energy resolution of 3.9 meV, very close to the theoretical value of 3.7 meV. In addition, the new spectrometer allows efficient polarization analysis without loss of energy resolution. The performance of the instrument is demonstrated using longitudinal acoustical and optical phonons in diamond, and magnon in Sr3Ir2O7. The novel sub-10 meV RIXS spectrometer thus provides a window into magnetic materials with small energy scales. © The Author(s) 2018-
dc.description.uri1-
dc.language영어-
dc.publisherNATURE PUBLISHING GROUP-
dc.titleQuartz-based flat-crystal resonant inelastic x-ray scattering spectrometer with sub-10 meV energy resolution-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000423663100037-
dc.identifier.scopusid2-s2.0-85041614680-
dc.identifier.rimsid66269-
dc.contributor.affiliatedAuthorBum Jun Kim-
dc.identifier.doi10.1038/s41598-018-20396-z-
dc.identifier.bibliographicCitationSCIENTIFIC REPORTS, v.8, no.1, pp.1958-
dc.citation.titleSCIENTIFIC REPORTS-
dc.citation.volume8-
dc.citation.number1-
dc.citation.startPage1958-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusGRADED MULTILAYER MIRROR-
dc.subject.keywordPlusANALYZER SYSTEM-
dc.subject.keywordPlusNSLS-II-
dc.subject.keywordPlusREFLECTIONS-
dc.subject.keywordPlusTESTS-
Appears in Collections:
Center for Artificial Low Dimensional Electronic Systems(원자제어 저차원 전자계 연구단) > 1. Journal Papers (저널논문)
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Sceintific Reports_김범준(공동)_Quartz-based flat-crystal resonant inelastic x-ray scattering spectrometer with sub-10 meV energy resolution.pdfDownload

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