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Spectral reflectometric microscopy on myelinated axons in situ

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dc.contributor.authorJunhwan Kwon-
dc.contributor.authorMyunghwan Choi-
dc.date.available2019-01-03T05:33:44Z-
dc.date.created2018-08-17-
dc.date.issued2018-07-
dc.identifier.issn1940-087X-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/5255-
dc.description.abstractIn a mammalian nervous system, myelin provides an electrical insulation by enwrapping the axon fibers in a multilayered spiral. Inspired by its highly-organized subcellular architecture, we recently developed a new imaging modality, named spectral reflectometry (SpeRe), which enables unprecedented label-free nanoscale imaging of the live myelinated axons in situ. The underlying principle is to obtain nanostructural information by analyzing the reflectance spectrum of the multilayered subcellular structure. In this article, we describe a detailed step-by-step protocol for performing a basic SpeRe imaging of the nervous tissues using a commercial confocal microscopic system, equipped with a white-light laser and a tunable filter. We cover the procedures of sample preparation, acquisition of spectral data, and image processing for obtaining nanostructural information.© 2018 Journal of Visualized Experiments-
dc.description.uri1-
dc.language영어-
dc.publisherJOURNAL OF VISUALIZED EXPERIMENTS-
dc.subjectInterferometry-
dc.subjectIssue 137-
dc.subjectLabel-free-
dc.subjectMicroscopy-
dc.subjectMyelinated axon-
dc.subjectNanostructure-
dc.subjectNeuroscience-
dc.subjectSpectral reflectometry-
dc.titleSpectral reflectometric microscopy on myelinated axons in situ-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000444836300074-
dc.identifier.scopusid2-s2.0-85049825495-
dc.identifier.rimsid64458-
dc.contributor.affiliatedAuthorJunhwan Kwon-
dc.contributor.affiliatedAuthorMyunghwan Choi-
dc.identifier.doi10.3791/57965-
dc.identifier.bibliographicCitationJOVE-JOURNAL OF VISUALIZED EXPERIMENTS, v.2018, no.137, pp.e57965-
dc.citation.titleJOVE-JOURNAL OF VISUALIZED EXPERIMENTS-
dc.citation.volume2018-
dc.citation.number137-
dc.citation.startPagee57965-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordAuthorInterferometry-
dc.subject.keywordAuthorIssue 137-
dc.subject.keywordAuthorLabel-free-
dc.subject.keywordAuthorMicroscopy-
dc.subject.keywordAuthorMyelinated axon-
dc.subject.keywordAuthorNanostructure-
dc.subject.keywordAuthorNeuroscience-
dc.subject.keywordAuthorSpectral reflectometry-
Appears in Collections:
Center for Neuroscience Imaging Research (뇌과학 이미징 연구단) > 1. Journal Papers (저널논문)
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