Impurity-Mediated Early Condensation of a Charge Density Wave in an Atomic Wire Array
DC Field | Value | Language |
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dc.contributor.author | Han Woong Yeom | - |
dc.contributor.author | Deok Mahn Oh | - |
dc.contributor.author | Stefan Wippermann | - |
dc.contributor.author | Wolf Gero Schmidt | - |
dc.date.available | 2016-05-11T12:16:22Z | - |
dc.date.created | 2016-04-26 | - |
dc.date.issued | 2016-01 | - |
dc.identifier.issn | 1936-0851 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/2473 | - |
dc.description.abstract | We directly show how impurity atoms induce the condensation of a representative electronic phase, the charge density wave (CDW) phase, in atomic scale with scanning tunneling microscopy. Oxygen impurity atoms on the self-assembled metallic atomic wire array on a silicon crystal condense the CDW locally above the pristine transition temperature. More interestingly, the CDW along the wires is induced not by a single atomic impurity but by the cooperation of multiple impurities. Firstprinciples calculations disclose the mechanism of the cooperation as the coherent superposition of the local lattice strain induced by impurities, stressing the coupled electronic and lattice degrees of freedom for the CDW. This opens the possibility of the strain engineering over electronic phases of atomic-scale systems. © 2015 American Chemical Society | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.subject | atomic wire, impurity, charge density wave, phase transition, scanning tunneling microscopy | - |
dc.title | Impurity-Mediated Early Condensation of a Charge Density Wave in an Atomic Wire Array | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000369115800087 | - |
dc.identifier.scopusid | 2-s2.0-84990942853 | - |
dc.identifier.rimsid | 55258 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Han Woong Yeom | - |
dc.contributor.affiliatedAuthor | Deok Mahn Oh | - |
dc.identifier.doi | 10.1021/acsnano.5b05925 | - |
dc.identifier.bibliographicCitation | ACS NANO, v.10, no.1, pp.810 - 814 | - |
dc.citation.title | ACS NANO | - |
dc.citation.volume | 10 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 810 | - |
dc.citation.endPage | 814 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 4 | - |
dc.description.scptc | 3 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | Atomic wire | - |
dc.subject.keywordAuthor | Charge density wave | - |
dc.subject.keywordAuthor | Impurity | - |
dc.subject.keywordAuthor | Phase transition | - |
dc.subject.keywordAuthor | Scanning tunneling microscopy | - |