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초강력레이저과학연구단
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Characterization of x-ray lens for use in probing high energy density states of matter

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dc.contributor.authorMabey, P-
dc.contributor.authorHartley, NJ-
dc.contributor.authorDoyle, HW-
dc.contributor.authorCross, JE-
dc.contributor.authorCeurvorst, L-
dc.contributor.authorSavin, A-
dc.contributor.authorRigby, A-
dc.contributor.authorOliver, M-
dc.contributor.authorCalvert, M-
dc.contributor.authorI Jong Kim-
dc.contributor.authorRiley, D-
dc.contributor.authorNorreys, PA-
dc.contributor.authorC.H. Nam-
dc.contributor.authorCarroll, DC-
dc.contributor.authorSpindloe, C-
dc.contributor.authorGregori, G-
dc.date.available2016-01-07T09:14:07Z-
dc.date.created2015-08-17-
dc.date.issued2015-04-
dc.identifier.issn1748-0221-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/2051-
dc.description.abstractBy using polycapillary lenses to focus laser-produced x-ray sources to high intensities, an improvement in signal-to-noise ratio can be achieved. Here the He-alpha line emission produced by driving a titanium backlighter target is focused by a polycapillary lens and the output characterized. The x-ray spot is measured to have a peak intensity of 4.5 x 10(7) photons, with a total photon count of 8.8 x 10(8) in 0.13 +/- 0.01 mm(2). This setup is equivalent to placing the backlighter target 3 mm from the sample with a 600 mu m diameter pinhole. The polycapillary lens enables the placement of the backlighter target at a much larger distance from the sample to be studied and therefore has the ability to greatly improve the signal-to-noise ratio on detectors. We demonstrate this with two simple diffraction experiments using pyrolytic graphite and polycrystalline aluminium-
dc.language영어-
dc.publisherIOP PUBLISHING LTD-
dc.titleCharacterization of x-ray lens for use in probing high energy density states of matter-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000357961700055-
dc.identifier.rimsid20793ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorI Jong Kim-
dc.contributor.affiliatedAuthorC.H. Nam-
dc.identifier.doi10.1088/1748-0221/10/04/P04010-
dc.identifier.bibliographicCitationJOURNAL OF INSTRUMENTATION, v.10, pp.P04010-
dc.relation.isPartOfJOURNAL OF INSTRUMENTATION-
dc.citation.titleJOURNAL OF INSTRUMENTATION-
dc.citation.volume10-
dc.citation.startPageP04010-
dc.date.scptcdate2015-08-17-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.subject.keywordPlusPLASMA-
dc.subject.keywordPlusIGNITION-
dc.subject.keywordPlusPULSES-
dc.subject.keywordAuthorPlasma diagnostics - probes-
dc.subject.keywordAuthorPlasma generation (laser-produced, RF, x ray-produced)-
dc.subject.keywordAuthorPlasma diagnostics - interferometry, spectroscopy and imaging-
Appears in Collections:
Center for Relativistic Laser Science(초강력 레이저과학 연구단) > 1. Journal Papers (저널논문)
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(Characterization)Dr. IJ Kim Journal of Instrumentation_2015.pdfDownload

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