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원자제어저차원전자계연구단
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An approach to breaking the 100-milli-Kelvin barrier in electron temperature with a dilution-refrigerator ultrahigh vacuum scanning tunneling microscope

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dc.contributor.authorUngdon Ham-
dc.contributor.authorHyeonjung Kim-
dc.contributor.authorJi-Soo Yoon-
dc.contributor.authorYang, Wooin-
dc.contributor.authorTae-Hwan Kim-
dc.contributor.authorJinho Lee-
dc.contributor.authorHan Woong Yeom-
dc.date.accessioned2024-12-17T05:00:15Z-
dc.date.available2024-12-17T05:00:15Z-
dc.date.created2024-12-11-
dc.date.issued2024-11-
dc.identifier.issn0034-6748-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/15938-
dc.description.abstractThis study presents a newly constructed dilution-refrigerator ultrahigh vacuum (UHV) scanning tunneling microscope (STM) with a 9/2/2 T superconducting vector magnet capable of achieving electron temperatures as low as 76 mK. Our design emphasizes robust thermal contacts, particularly with the sample holder through a thin insulating layer. Additionally, we focus on effective shielding and grounding against radio-frequency electromagnetic interference by integrating the critical electronics as a physically and electrically integral component of the STM setup. Scanning tunneling spectroscopy results obtained from a superconducting aluminum substrate and a gold tip indicate superior energy resolution, with a higher aspect ratio of the superconducting coherence peak in the dI/dV spectra compared to other dilution-refrigerator UHV STMs. Given that only a handful of UHV STMs with dilution refrigerators have reached electron temperatures below 100 mK, these results demonstrate the effectiveness of our design and methodology in achieving low electron temperatures.-
dc.language영어-
dc.publisherAmerican Institute of Physics-
dc.titleAn approach to breaking the 100-milli-Kelvin barrier in electron temperature with a dilution-refrigerator ultrahigh vacuum scanning tunneling microscope-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid001364197000003-
dc.identifier.scopusid2-s2.0-85210284239-
dc.identifier.rimsid84644-
dc.contributor.affiliatedAuthorUngdon Ham-
dc.contributor.affiliatedAuthorHyeonjung Kim-
dc.contributor.affiliatedAuthorJi-Soo Yoon-
dc.contributor.affiliatedAuthorJinho Lee-
dc.contributor.affiliatedAuthorHan Woong Yeom-
dc.identifier.doi10.1063/5.0233223-
dc.identifier.bibliographicCitationReview of Scientific Instruments, v.95, no.11-
dc.relation.isPartOfReview of Scientific Instruments-
dc.citation.titleReview of Scientific Instruments-
dc.citation.volume95-
dc.citation.number11-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusRESOLUTION-
dc.subject.keywordPlusDENSITY-WAVE-
dc.subject.keywordPlusSPECTROSCOPY-
Appears in Collections:
Center for Artificial Low Dimensional Electronic Systems(원자제어 저차원 전자계 연구단) > 1. Journal Papers (저널논문)
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