Work function engineering of single layer graphene by irradiation-induced defects
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jong-Hun Kim | - |
dc.contributor.author | Jin Heui Hwang | - |
dc.contributor.author | Joonki Suh | - |
dc.contributor.author | Sefaattin Tongay | - |
dc.contributor.author | Sangku Kwon | - |
dc.contributor.author | C. C. Hwang | - |
dc.contributor.author | Junqiao Wu | - |
dc.contributor.author | Jeong Young Park | - |
dc.date.available | 2015-04-21T09:35:35Z | - |
dc.date.created | 2014-09-30 | ko |
dc.date.issued | 2013-10 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/1567 | - |
dc.description.abstract | We report the tuning of electrical properties of single layer graphene by a-beam irradiation. As the defect density increases upon irradiation, the surface potential of the graphene changes, as determined by Kelvin probe force microscopy and Raman spectroscopy studies. X-ray photoelectron spectroscopy studies indicate that the formation of C/O bonding is promoted as the dose of irradiation increases when at atmospheric conditions. Our results show that the surface potential of the graphene can be engineered by introducing atomic-scale defects via irradiation with high-energy particles. (C) 2013 AIP Publishing LLC. | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Work function engineering of single layer graphene by irradiation-induced defects | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000326455100017 | - |
dc.identifier.scopusid | 2-s2.0-84887042213 | - |
dc.identifier.rimsid | 5798 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Jong-Hun Kim | - |
dc.contributor.affiliatedAuthor | Jin Heui Hwang | - |
dc.contributor.affiliatedAuthor | Sangku Kwon | - |
dc.contributor.affiliatedAuthor | Jeong Young Park | - |
dc.identifier.doi | 10.1063/1.4826642 | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.103, no.17, pp.171604 - 171605 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 103 | - |
dc.citation.number | 17 | - |
dc.citation.startPage | 171604 | - |
dc.citation.endPage | 171605 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 57 | - |
dc.description.scptc | 58 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |