Single-shot carrier-envelope-phase detection using tunneling ionization in ambient air
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bin Kim | - |
dc.contributor.author | Jeong-Uk Shin | - |
dc.contributor.author | Wosik Cho | - |
dc.contributor.author | Yang Hwan Kim | - |
dc.contributor.author | Kyung Hoon Yeom | - |
dc.contributor.author | Kyung Taec Kim | - |
dc.date.accessioned | 2024-12-12T07:08:16Z | - |
dc.date.available | 2024-12-12T07:08:16Z | - |
dc.date.created | 2024-09-23 | - |
dc.date.issued | 2024-09 | - |
dc.identifier.issn | 1094-4087 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/15650 | - |
dc.description.abstract | The carrier-envelope phase (CEP) of a laser pulse plays a crucial role in laser-matter interactions. The inherent shot-to-shot instability of the CEP necessitates single-shot detection, which is not only vital for stabilizing the CEP but also for observing ultrafast phenomena that conventional averaging techniques cannot resolve. In this study, we demonstrate a novel approach utilizing strong-field ionization in ambient air for single-shot CEP measurement. Our method is applicable without the need for an imaging device, providing a practical and precise solution for high-repetition-rate CEP measurement. © 2024 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement. | - |
dc.language | 영어 | - |
dc.publisher | Optical Society of America | - |
dc.title | Single-shot carrier-envelope-phase detection using tunneling ionization in ambient air | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 001317475900010 | - |
dc.identifier.scopusid | 2-s2.0-85203851593 | - |
dc.identifier.rimsid | 84100 | - |
dc.contributor.affiliatedAuthor | Bin Kim | - |
dc.contributor.affiliatedAuthor | Jeong-Uk Shin | - |
dc.contributor.affiliatedAuthor | Wosik Cho | - |
dc.contributor.affiliatedAuthor | Yang Hwan Kim | - |
dc.contributor.affiliatedAuthor | Kyung Hoon Yeom | - |
dc.contributor.affiliatedAuthor | Kyung Taec Kim | - |
dc.identifier.doi | 10.1364/OE.530546 | - |
dc.identifier.bibliographicCitation | Optics Express, v.32, no.19, pp.33795 - 33802 | - |
dc.relation.isPartOf | Optics Express | - |
dc.citation.title | Optics Express | - |
dc.citation.volume | 32 | - |
dc.citation.number | 19 | - |
dc.citation.startPage | 33795 | - |
dc.citation.endPage | 33802 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | Y | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalWebOfScienceCategory | Optics | - |