Temporal characterization of a two-color laser field using tunneling ionization
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jeong-uk Shin | - |
dc.contributor.author | Igor Ivanov | - |
dc.contributor.author | Woo Sik Cho | - |
dc.contributor.author | Rajaram Shrestha | - |
dc.contributor.author | Kyung Taec Kim | - |
dc.date.accessioned | 2022-09-06T22:01:09Z | - |
dc.date.available | 2022-09-06T22:01:09Z | - |
dc.date.created | 2022-08-26 | - |
dc.date.issued | 2022-08 | - |
dc.identifier.issn | 1094-4087 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/12277 | - |
dc.description.abstract | The superposition of a fundamental laser pulse and its second harmonic can form an asymmetric laser field that is useful in many applications. The temporal characterization of the two-color laser field becomes necessary. However, the temporal characterization of the two-color laser pulse is a challenging task due to its broad bandwidth and a spectral gap between the two frequency components. Here we demonstrate the temporal characterization of the two-color laser field using multiple ionization yield measurements near the laser focus. This new approach enables the complete temporal characterization of the two-color laser field, including the relative phase between the two frequency components. (C) 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement | - |
dc.language | 영어 | - |
dc.publisher | Optica Publishing Group | - |
dc.title | Temporal characterization of a two-color laser field using tunneling ionization | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000836698500035 | - |
dc.identifier.scopusid | 2-s2.0-85135061418 | - |
dc.identifier.rimsid | 78705 | - |
dc.contributor.affiliatedAuthor | Jeong-uk Shin | - |
dc.contributor.affiliatedAuthor | Igor Ivanov | - |
dc.contributor.affiliatedAuthor | Woo Sik Cho | - |
dc.contributor.affiliatedAuthor | Rajaram Shrestha | - |
dc.contributor.affiliatedAuthor | Kyung Taec Kim | - |
dc.identifier.doi | 10.1364/OE.464586 | - |
dc.identifier.bibliographicCitation | OPTICS EXPRESS, v.30, no.16, pp.28686 - 28695 | - |
dc.relation.isPartOf | OPTICS EXPRESS | - |
dc.citation.title | OPTICS EXPRESS | - |
dc.citation.volume | 30 | - |
dc.citation.number | 16 | - |
dc.citation.startPage | 28686 | - |
dc.citation.endPage | 28695 | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.subject.keywordPlus | PULSES | - |
dc.subject.keywordPlus | INTERFEROMETRY | - |