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원자제어 저차원 전자계 연구단
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Electronic and vibrational signatures of ruthenium vacancies in Sr2RuO4 thin films

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Title
Electronic and vibrational signatures of ruthenium vacancies in Sr2RuO4 thin films
Author(s)
Kim, G; Suyolcu, YE; Herrero-Martin, J; Putzky, D; Nair, HP; Ruf, JP; Schreiber, NJ; C. Dietl; Christiani, G; Logvenov, G; Minola, M; van Aken, PA; Shen, KM; Schlom, DG; Keimer, B
Publication Date
2019-09
Journal
PHYSICAL REVIEW MATERIALS, v.3, no.9, pp.094802 -
Publisher
AMER PHYSICAL SOC
Abstract
© 2019 American Physical Society.The synthesis of stoichiometric Sr2RuO4 thin films has been a challenge because of the high volatility of ruthenium oxide precursors, which gives rise to ruthenium vacancies in the films. Ru vacancies greatly affect the transport properties and electronic phase behavior of Sr2RuO4, but their direct detection is difficult due to their atomic dimensions and low concentration. We applied polarized X-ray absorption spectroscopy at the oxygen K edge and confocal Raman spectroscopy to Sr2RuO4 thin films synthesized under different conditions. The results show that these methods can serve as sensitive probes of the electronic and vibrational properties of Ru vacancies, respectively. The intensities of the vacancy-related spectroscopic features extracted from these measurements are well correlated with the transport properties of the films. The methodology introduced here can thus help one to understand and control the stoichiometry and transport properties in films of Sr2RuO4 and other ruthenates
URI
https://pr.ibs.re.kr/handle/8788114/6875
ISSN
2475-9953
Appears in Collections:
Center for Artificial Low Dimensional Electronic Systems(원자제어 저차원 전자계 연구단) > Journal Papers (저널논문)
Files in This Item:
2019_크리스토퍼(공동)_PhysRevMaterials_Electronic and vibrational signatures of ruthenium vacancies in Sr2RuO4 thin films.pdfDownload

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