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원자제어저차원전자계연구단
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Metrology of band topology via resonant inelastic x-ray scattering

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Title
Metrology of band topology via resonant inelastic x-ray scattering
Author(s)
Sangjin Lee; Kyung-Hwan Jin; Kang, Byungmin; Bumjoon Kim; Gil Young Cho
Publication Date
2023-01
Journal
Physical Review B, v.107, no.4
Publisher
American Physical Society
Abstract
Topology is a central notion in the classification of band insulators and the characterization of entangled many-body quantum states. In some cases, it manifests as quantized observables such as quantum Hall conductance. However, being inherently a global property depending on the entirety of the system, its direct measurement has remained elusive to local experimental probes in many cases. Here, we demonstrate that various topological band indices can be directly probed by resonant inelastic x-ray scattering. Specifically, we show that the crystalline symmetry eigenvalues at the high-symmetry momentum points, which determine the band topology, lead to distinct scattering intensity for particular momentum and energy. Our approach can be explicitly demonstrated in several examples such as 1D Su-Schrieffer-Heeger chain, 2D quadrupole insulator, 3D topological band insulator, and chiral hinge insulator. Our result establishes an incisive bulk probe for the measurement of band topology.
URI
https://pr.ibs.re.kr/handle/8788114/13186
DOI
10.1103/PhysRevB.107.045129
ISSN
2469-9950
Appears in Collections:
Center for Artificial Low Dimensional Electronic Systems(원자제어 저차원 전자계 연구단) > 1. Journal Papers (저널논문)
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