An optimized scheme for detecting magneto-optic effects in ultrathin films with Sagnac interferometry
DC Field | Value | Language |
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dc.contributor.author | Zhu, X.D. | - |
dc.contributor.author | E.K. Ko | - |
dc.contributor.author | Kimbell, G. | - |
dc.contributor.author | Robinson, J. | - |
dc.date.accessioned | 2023-01-26T02:47:48Z | - |
dc.date.available | 2023-01-26T02:47:48Z | - |
dc.date.created | 2022-10-29 | - |
dc.date.issued | 2022-09 | - |
dc.identifier.issn | 0034-6748 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/12745 | - |
dc.description.abstract | © 2022 Author(s).Sagnac interferometry is advantageous in measuring time-reversal-symmetry breaking effects in ferromagnetic and antiferromagnetic materials as it suppresses time-reversal symmetric birefringent effects that are ubiquitous and often overwhelming in optical detection systems. When its sensitivity is limited only by the amplifier noise in the photo-detector, one needs to optimize the optical power that returns to the detector. We demonstrate an experimental scheme that maximizes the returning optical power in a Sagnac interferometry when detecting the magneto-optic effect in ultrathin films. In this scheme, the optical beam bearing the Faraday effect on a thin film is reflected at a second surface coated with a highly reflective gold film. The gold film increases the returned optical power by a factor of 4-5. For a normal-incidence Sagnac interferometer, this scheme yields an increase in the signal-to-noise ratio by the same factor. For an oblique-incidence Sagnac interferometer, this scheme should yield an increase in the signal-to-noise ratio by a factor of 20-25. For illustration, this scheme is used to measure magnetization curves and Kerr rotation images of 4.5-unit-cell thick SrRuO3(001) grown on SrTiO3(001). | - |
dc.language | 영어 | - |
dc.publisher | American Institute of Physics Inc. | - |
dc.title | An optimized scheme for detecting magneto-optic effects in ultrathin films with Sagnac interferometry | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000957476200007 | - |
dc.identifier.scopusid | 2-s2.0-85138480043 | - |
dc.identifier.rimsid | 79005 | - |
dc.contributor.affiliatedAuthor | E.K. Ko | - |
dc.identifier.doi | 10.1063/5.0090061 | - |
dc.identifier.bibliographicCitation | Review of Scientific Instruments, v.93, no.9 | - |
dc.relation.isPartOf | Review of Scientific Instruments | - |
dc.citation.title | Review of Scientific Instruments | - |
dc.citation.volume | 93 | - |
dc.citation.number | 9 | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |