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Publication DateTitleAuthor(s)
2017-10Degradation pattern of black phosphorus multilayer field−effect transistors in ambient conditions: Strategy for contact resistance engineering in BP transistorsByung Chul Lee; Chul Min Kim; Ho-Kyun Jang, et al
2014-04Passivation effect on gate-bias stress instability of carbon nanotube thin film transistorsSang Won Lee; Dongseok Suh; Si Young Lee, et al
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