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Publication Date2016-10 The Origin of Improved Electrical Double-Layer Capacitance by Inclusion of Topological Defects and Dopants in Graphene for Supercapacitors
Jiafeng Chen; Yulei Han; Xianghua Kong, et al
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, v.55, no.44, pp.13822 - 13827

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